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Direct comparison of the results of arsenic ion implantation in n– and p–type Hg0.8Cd0.2Te I. I. Izhnin, K. D. Mynbaev, Z. Swiatek [et al.] by Mynbaev, Karim D | Świątek, Zbigniew | Morgiel, Jerzy | Voytsekhovskiy, Alexander V | Korotaev, Alexander G | Varavin, Vasilii S | Dvoretsky, Sergei A | Marin, Denis V | Yakushev, Maxim V | Izhnin, Igor I | Fitsych, Olena I | Bonchyk, A. Yu | Savytskyy, Hrygory V. Source: Infrared physics and technologyMaterial type: Article; Format:
electronic
available online
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Nano‑scale structural studies of defects in arsenic‑implanted n and p‑type HgCdTe films I. I. Izhnin, A. V. Voytsekhovskiy, A. G. Korotaev [et al.] by Izhnin, Igor I | Voytsekhovskiy, Alexander V | Korotaev, Alexander G | Mynbaev, Karim D | Świątek, Zbigniew | Morgiel, Jerzy | Fitsych, Olena I | Varavin, Vasilii S | Marin, Denis V | Yakushev, Maxim V | Bonchyk, A. Yu | Savytskyy, Hrygory V. Source: Applied nanoscienceMaterial type: Article; Format:
electronic
available online
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Nano‑size defect layers in arsenic‑implanted and annealed HgCdTe epitaxial films studied with transmission electron microscopy O. Yu. Bonchyk, H. V. Savytskyy, I. I. Izhnin [et al.] by Izhnin, Igor I | Mynbaev, Karim D | Syvorotka, I. I | Korotaev, Alexander G | Voytsekhovskiy, Alexander V | Fitsych, Olena I | Varavin, Vasilii S | Marin, Denis V | Bonchyk, A. Yu | Mikhailov, Nikolay N | Yakushev, Maxim V | Świątek, Zbigniew | Morgiel, Jerzy | Jakiela, Rafal | Savytskyy, Hrygory V. Source: Applied nanoscienceMaterial type: Article; Format:
electronic
available online
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Accumulation and annealing of radiation donor defects in arsenic-implanted Hg0.7Cd0.3Te films A. V. Voytsekhovskiy, A. G. Korotaev, I. I. Izhnin [et al.] by Voytsekhovskiy, Alexander V | Korotaev, Alexander G | Izhnin, Igor I | Mynbaev, Karim D | Yakushev, Maxim V | Mikhailov, Nikolay N | Varavin, Vasilii S | Dvoretsky, Sergei A | Marin, Denis V | Fitsych, Olena I | Kurbanov, Kurban R. Source: 2020 7th International Congress on energy fluxes and radiation effects (EFRE 2020), Tomsk, Russia, September 14 – 26, 2020 : proceedingsMaterial type: Article; Format:
electronic
available online
; Literary form:
Not fiction
; Audience:
Specialized;
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Electrical profiling of arsenic-implanted HgCdTe films performed with discrete mobility spectrum analysis I. I. Izhnin, I. I. Syvorotka, O. I. Fitsych [et al.] by Syvorotka, I. I | Fitsych, Olena I | Varavin, Vasilii S | Dvoretsky, Sergei A | Marin, Denis V | Mikhailov, Nikolay N | Remesnik, V. G | Yakushev, Maxim V | Mynbaev, Karim D | Izhnin, Igor I | Voytsekhovskiy, Alexander V | Korotaev, Alexander G. Source: Semiconductor science and technologyMaterial type: Article; Format:
electronic
available online
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Influence of As+ Ion implantation on properties of MBE HgCdTe near-surface layer characterized by metal–insulator–semiconductor techniques A. V. Voytsekhovskiy, S. N. Nesmelov, S. M. Dzyadukh [et al.] by Voytsekhovskiy, Alexander V | Nesmelov, Sergey N | Dzyadukh, Stanislav M | Varavin, Vasilii S | Dvoretsky, Sergei A | Mikhailov, Nikolay N | Sidorov, Georgiy Yu | Yakushev, Maxim V | Marin, Denis V. Source: Journal of electronic materialsMaterial type: Article; Format:
electronic
available online
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The effect of As+ Ion implantation and annealing on the electrical properties of near-surface layers in graded-gap n-Hg0.78Cd0.22Te films A. V. Voytsekhovskiy, S. N. Nesmelov, S. M. Dzyadukh [et al.] by Voytsekhovskiy, Alexander V | Nesmelov, Sergey N | Dzyadukh, Stanislav M | Varavin, Vasilii S | Dvoretsky, Sergei A | Mikhailov, Nikolay N | Sidorov, Georgiy Yu | Yakushev, Maxim V | Marin, Denis V. Source: Technical physics lettersMaterial type: Article; Format:
electronic
available online
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Nano-size defects in arsenic-implanted HgCdTe films: a HRTEM study O. Yu. Bonchyk, H. V. Savytskyy, Z. Świątek [et al.] by Savytskyy, Hrygory V | Świątek, Zbigniew | Morgiel, Jerzy | Izhnin, Igor I | Voytsekhovskiy, Alexander V | Korotaev, Alexander G | Mynbaev, Karim D | Fitsych, Olena I | Varavin, Vasilii S | Bonchyk, A. Yu | Dvoretsky, Sergei A | Marin, Denis V | Yakushev, Maxim V. Source: Applied nanoscienceMaterial type: Article; Format:
electronic
available online
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Effect of annealing on the structural properties of arsenic-implanted mercury cadmium telluride I. Izhnin, O. I. Fitsych, Z. Świątek [et al.] by Fitsych, Olena I | Świątek, Zbigniew | Morgiel, Jerzy | Bonchyk, A. Yu | Savytskyy, Hrygory V | Mynbaev, Karim D | Voytsekhovskiy, Alexander V | Korotaev, Alexander G | Yakushev, Maxim V | Marin, Denis V | Varavin, Vasilii S | Dvoretsky, Sergei A | Izhnin, Igor I. Source: Opto-electronics reviewMaterial type: Article; Format:
electronic
available online
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Investigation of the effect of thermal annealing on the electrical properties of the near-surface layer of MBE n-HgCdTe using MIS techniques A. V. Voytsekhovskii, S. N. Nesmelov, S. M. Dzyadukh [et al.] by Nesmelov, Sergey N | Dzyadukh, Stanislav M | Varavin, Vasilii S | Dvoretsky, Sergei A | Mikhailov, Nikolay N | Sidorov, Georgiy Yu | Yakushev, Maxim V | Marin, Denis V | Voytsekhovskiy, Alexander V. Source: Journal of electronic materialsMaterial type: Article; Format:
electronic
available online
Online access: Click here to access online Availability: No items available :
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