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Simplification of fully delay testable combinational circuits A. Matrosova, E. Mitrofanov, T. Shah by Matrosova, Anzhela Yu | Mitrofanov, Evgenii V | Shah, Toral. Source: Proceedings of the 21st IEEE International On-Line Testing Symposium Symposium (IOLTS), 6-8 July 2015, Athena Pallas Village, Elia, Halkidiki, GreeceMaterial type:  Article; Format:
electronic
available online
 ; Literary form:
Not fiction
; Audience:
Specialized;
Online access: Click here to access online Availability: No items available :
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