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Simplification of fully delay testable combinational circuits A. Matrosova, E. Mitrofanov, T. Shah
Material type: ArticleSubject(s): неисправности задержек путей | ROBDD-графы | контролепригодный синтезGenre/Form: статьи в сборниках Online resources: Click here to access online In: Proceedings of the 21st IEEE International On-Line Testing Symposium Symposium (IOLTS), 6-8 July 2015, Athena Pallas Village, Elia, Halkidiki, Greece P. 44-45No physical items for this record
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