Normal view
MARC view
Direct measurement of surface stress during Bi-mediated Ge growth on Si H. Asaoka, T. Yamazaki, K Yamaguchi [et.al.]
Material type: ArticleSubject(s): молекулярно-лучевая эпитаксия | поверхностное напряжениеGenre/Form: статьи в журналах Online resources: Click here to access online In: Surface science Vol. 609. P. 157-160No physical items for this record
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