Scientific Library of Tomsk State University

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    • Your search returned 11 results.

    1.
    Digital Timing Measurements Электронный ресурс From Scopes and Probes to Timing and Jitter / by Wolfgang Maichen.

    by Maichen, Wolfgang | SpringerLink (Online service).

    Series: Frontiers in Electronic TestingSource: Springer e-booksMaterial type: Computer file Computer file; Format: electronic available online remote Publication details: New York, NY : Springer US, 2006Online access: Click here to access online Availability: No items available :
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    2.
    The Core Test Wrapper Handbook Электронный ресурс Rationale and Application of IEEE Std. 1500в„ў / by Francisco Silva, Teresa McLaurin, Tom Waayers.

    by Silva, Francisco | McLaurin, Teresa | Waayers, Tom | SpringerLink (Online service).

    Series: Frontiers in Electronic TestingSource: Springer e-booksMaterial type: Computer file Computer file; Format: electronic available online remote Publication details: Boston, MA : Springer Science+Business Media, LLC, 2006Online access: Click here to access online Availability: No items available :
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    3.
    Fault Diagnosis of Analog Integrated Circuits Электронный ресурс by Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha.

    by Kabisatpathy, Prithviraj | Barua, Alok | Sinha, Satyabroto | SpringerLink (Online service).

    Series: Frontiers in Electronic TestingSource: Springer e-booksMaterial type: Computer file Computer file; Format: electronic available online remote Publication details: Boston, MA : Springer, 2005Online access: Click here to access online Availability: No items available :
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    4.
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits Электронный ресурс 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez.

    by Sachdev, Manoj | Gyvez, José Pineda de | SpringerLink (Online service).

    Series: Frontiers in Electronic TestingSource: Springer e-booksMaterial type: Computer file Computer file; Format: electronic available online remote Publication details: Boston, MA : Springer, 2007Online access: Click here to access online Availability: No items available :
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    5.
    Emerging Nanotechnologies Электронный ресурс Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor.

    by Tehranipoor, Mohammad | SpringerLink (Online service).

    Series: Frontiers in Electronic TestingSource: Springer eBooksMaterial type: Computer file Computer file; Format: electronic available online remote Publication details: Boston, MA : Springer Science+Business Media, LLC, 2008Online access: Click here to access online Availability: No items available :
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    6.
    New Methods of Concurrent Checking Электронный ресурс by Michael Göessel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld.

    by Göessel, Michael | Marienfeld, Daniel | Ocheretny, Vitaly | Sogomonyan, Egor | SpringerLink (Online service).

    Series: Frontiers In Electronic TestingSource: Springer eBooksMaterial type: Computer file Computer file; Format: electronic available online remote Publication details: Dordrecht : Springer Science+Business Media B.V., 2008Online access: Click here to access online Availability: No items available :
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    7.
    Data Mining and Diagnosing IC Fails Электронный ресурс by Leendert M. Huisman.

    by Huisman, Leendert M | SpringerLink (Online service).

    Series: Frontiers in Electronic TestingSource: Springer e-booksMaterial type: Computer file Computer file; Format: electronic available online remote Publication details: Boston, MA : Springer Science+Business Media, Inc., 2005Online access: Click here to access online Availability: No items available :
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    8.
    Oscillation-Based Test in Mixed-Signal Circuits Электронный ресурс by Gloria Huertas Sánchez, Diego García de la Vega, Adoración Rueda, José Luis Huertas Díaz

    by Sánchez, Gloria Huertas | Díaz, José Luis Huertas | García, Diego | Rueda, Adoración | SpringerLink (Online service).

    Series: Frontiers in Electronic Testing 36 ; 36Source: Springer e-booksMaterial type: Computer file Computer file; Format: electronic available online remote Publication details: Dordrecht Springer 2006Online access: Click here to access online Availability: No items available :
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    9.
    CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Электронный ресурс Process-Aware SRAM Design and Test / by Andrei Pavlov, Manoj Sachdev.

    by Pavlov, Andrei | Sachdev, Manoj | SpringerLink (Online service).

    Series: Frontiers In Electronic TestingSource: Springer eBooksMaterial type: Computer file Computer file; Format: electronic available online remote Publication details: Dordrecht : Springer Science + Business Media B.V, 2008Online access: Click here to access online Availability: No items available :
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    10.
    Introduction to Advanced System-on-Chip Test Design and Optimization Электронный ресурс by Erik Larsson.

    by Larsson, Erik | SpringerLink (Online service).

    Series: Frontiers in Electronic TestingSource: Springer e-booksMaterial type: Computer file Computer file; Format: electronic available online remote Publication details: Boston, MA : Springer, 2005Online access: Click here to access online Availability: No items available :
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    11.
    Gizopoulos / Advances in ElectronicTesting Электронный ресурс edited by Dimitris Gizopoulos.

    by Gizopoulos, Dimitris | SpringerLink (Online service).

    Series: Frontiers in Electronic TestingSource: Springer e-booksMaterial type: Computer file Computer file; Format: electronic available online remote Publication details: Boston, MA : Springer, 2006Online access: Click here to access online Availability: No items available :
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