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Data Mining and Diagnosing IC Fails Электронный ресурс by Leendert M. Huisman.
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Computer fileSeries: Frontiers in Electronic TestingPublication details: Boston, MA : Springer Science+Business Media, Inc., 2005ISBN: 9780387263519Subject(s): electronics | engineering | Systems engineering | Engineering | Circuits and Systems | Electronics and Microelectronics, InstrumentationOnline resources: Click here to access online
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