Scientific Library of Tomsk State University

   E-catalog        

Normal view MARC view

Indentation fracture toughness of single-crystal Bi2Te3 topological insulators C. Lamuta, A. Cupolillo, A. Politano [et.al.]

Contributor(s): Lamuta, Caterina | Politano, Antonio | Aliev, Ziya S | Babanly, Mahammad B | Chulkov, Evgueni V | Pagnotta, Leonardo | Cupolillo, AnnaMaterial type: ArticleArticleSubject(s): теллурид висмута | термоэлектрические материалы | топологические изоляторы | вязкость разрушения | наноиндентированиеGenre/Form: статьи в журналах Online resources: Click here to access online In: Nano research Vol. 9, № 4. P. 1032-1042Abstract: Bismuth telluride (Bi2Te3) is one of the most important commercial thermoelectric materials. In recent years, the discovery of topologically protected surface states in Bi chalcogenides has paved the way for their application in nanoelectronics. Determination of the fracture toughness plays a crucial role for the potential application of topological insulators in flexible electronics and nanoelectromechanical devices. Using depth-sensing nanoindentation tests, we investigated for the first time the fracture toughness of bulk single crystals of Bi2Te3 topological insulators, grown using the Bridgman-Stockbarger method. Our results highlight one of the possible pitfalls of the technology based on topological insulators.
Tags from this library: No tags from this library for this title. Log in to add tags.
No physical items for this record

Библиогр.: 77 назв.

Bismuth telluride (Bi2Te3) is one of the most important commercial thermoelectric materials. In recent years, the discovery of topologically protected surface states in Bi chalcogenides has paved the way for their application in nanoelectronics. Determination of the fracture toughness plays a crucial role for the potential application of topological insulators in flexible electronics and nanoelectromechanical devices. Using depth-sensing nanoindentation tests, we investigated for the first time the fracture toughness of bulk single crystals of Bi2Te3 topological insulators, grown using the Bridgman-Stockbarger method. Our results highlight one of the possible pitfalls of the technology based on topological insulators.

There are no comments on this title.

to post a comment.
Share