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A statistical test suite for random and pseudorandom number generators for cryptographic applications Andrew Rukhin, Juan Soto, James Nechvatal [a. o.] ; revised: Lawrence E. Bassham III

Contributor(s): Rukhin, Andrew | Nechvatal, James | Soto, Juan | Bassham, Lawrence E [edt]Material type: TextTextSeries: NIST special publicationPublication details: Gaithersburg U.S. Department of Commerce, National Institute of Standards and Technology 2010Description: Various pagings illSubject(s): криптографические приложения | статистические тесты | генераторы случайных чисел | криптоанализOnline resources: Click here to access online
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