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Transmission electron microscopy of semiconductor nanostructures an analysis of composition and strain state Andreas Rosenauer
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Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Выдается в читальный зал | Книгохранилище | 2-057399 (Browse shelf (Opens below)) | Available | 13820000575214 |
Includes bibliographical references
Index: p. 235-238
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