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Nano‑scale structural studies of defects in arsenic‑implanted n and p‑type HgCdTe films I. I. Izhnin, A. V. Voytsekhovskiy, A. G. Korotaev [et al.] by Izhnin, Igor I | Voytsekhovskiy, Alexander V | Korotaev, Alexander G | Mynbaev, Karim D | Świątek, Zbigniew | Morgiel, Jerzy | Fitsych, Olena I | Varavin, Vasilii S | Marin, Denis V | Yakushev, Maxim V | Bonchyk, A. Yu | Savytskyy, Hrygory V. Source: Applied nanoscienceMaterial type:  Article; Format:
electronic
available online
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Electrical profiling of arsenic-implanted HgCdTe films performed with discrete mobility spectrum analysis I. I. Izhnin, I. I. Syvorotka, O. I. Fitsych [et al.] by Syvorotka, I. I | Fitsych, Olena I | Varavin, Vasilii S | Dvoretsky, Sergei A | Marin, Denis V | Mikhailov, Nikolay N | Remesnik, V. G | Yakushev, Maxim V | Mynbaev, Karim D | Izhnin, Igor I | Voytsekhovskiy, Alexander V | Korotaev, Alexander G. Source: Semiconductor science and technologyMaterial type: Article; Format:
electronic
available online
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Nano‑size defect layers in arsenic‑implanted and annealed HgCdTe epitaxial films studied with transmission electron microscopy O. Yu. Bonchyk, H. V. Savytskyy, I. I. Izhnin [et al.] by Izhnin, Igor I | Mynbaev, Karim D | Syvorotka, I. I | Korotaev, Alexander G | Voytsekhovskiy, Alexander V | Fitsych, Olena I | Varavin, Vasilii S | Marin, Denis V | Bonchyk, A. Yu | Mikhailov, Nikolay N | Yakushev, Maxim V | Świątek, Zbigniew | Morgiel, Jerzy | Jakiela, Rafal | Savytskyy, Hrygory V. Source: Applied nanoscienceMaterial type: Article; Format:
electronic
available online
Online access: Click here to access online Availability: No items available :
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