Nano‑size defect layers in arsenic‑implanted and annealed HgCdTe epitaxial films studied with transmission electron microscopy O. Yu. Bonchyk, H. V. Savytskyy, I. I. Izhnin [et al.] by Izhnin, Igor I | Mynbaev, Karim D | Syvorotka, I. I | Korotaev, Alexander G | Voytsekhovskiy, Alexander V | Fitsych, Olena I | Varavin, Vasilii S | Marin, Denis V | Bonchyk, A. Yu | Mikhailov, Nikolay N | Yakushev, Maxim V | Świątek, Zbigniew | Morgiel, Jerzy | Jakiela, Rafal | Savytskyy, Hrygory V.
Source: Applied nanoscienceMaterial type: Article; Format:
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