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Scanning Probe Microscopy Электронный ресурс Electrical and Electromechanical Phenomena at the Nanoscale / edited by Sergei Kalinin, Alexei Gruverman.
Material type: Computer filePublication details: New York, NY : Springer Science+Business Media, LLC, 2007ISBN: 9780387286686Subject(s): Mechanical engineering | Microscopy | Nanotechnology | Particles (Nuclear physics) | Surfaces (Physics) | chemistry | Biological Microscopy | Characterization and Evaluation of Materials | Mechanical Engineering | Nanotechnology | Solid State Physics and Spectroscopy | Surfaces and Interfaces, Thin FilmsOnline resources: Click here to access online In: Springer e-booksNo physical items for this record
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