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CCD Image Sensors in Deep-Ultraviolet Электронный ресурс Degradation Behavior and Damage Mechanisms / by Flora M. Li, Arokia Nathan.
Material type:
Computer fileSeries: Microtechnology and MemsPublication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005ISBN: 9783540274124Subject(s): electronics | engineering | Optical materials | Spectrum analysis | chemistry | Electronics and Microelectronics, Instrumentation | Optical and Electronic Materials | Optical Spectroscopy, Ultrafast Optics | Physics and Applied Physics in EngineeringOnline resources: Click here to access online
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Springer e-books
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