000 02646nab a2200325 c 4500
001 vtls000620776
003 RU-ToGU
005 20240425144109.0
007 cr |
008 180207|2017 enk s a eng dd
024 7 _a10.1016/j.matpr.2017.04.072
_2doi
035 _ato000620776
040 _aRU-ToGU
_brus
_cRU-ToGU
245 1 0 _aTwo-way shape memory effect in [001] B2-oriented Co-Ni-Al single crystals
_cA. Eftifeeva, E. Panchenko, Y. Chumlyakov, H. J. Maier
504 _aБиблиогр.: 15 назв.
520 3 _aIn the present study, the necessary conditions for the two-way shape memory effect (TWSME) and its stress-free thermal cycling stability in the Co35Ni35Al30 single crystals, oriented along the [001]B2 direction, were investigated. The TWSME is attributed to the internal stress fields created through the generation of stable dislocation structures and retained martensite in two ways. First, the training involved 100 loading/unloading cycles at room temperature T=295 К with the maximum given strain of 6.0% in compression. Second, the ageing at T=423 К for 1.0 h under a stress of 500 MPa was applied to the martensitic state along the [001]B2[110]L10 direction. It was experimentally shown that the aged crystals demonstrated the best properties of the TWSME response when compared with the trained crystals: i.e., a higher operating temperature range (250-297 K), the high cyclic stability of the reversible strain εTWSME=(3.10.3)% during thermal cycles and the low value of the temperature hysteresis (ΔT=24 К). In contrast, in the trained crystals the operating temperature range of the TWSME is shifted towards a low temperature region (220-275 K), after 100 thermal cycles the reversible strain εTWSME is significant decreased from 3.0 to 2.0 % and the temperature hysteresis ΔT is increased from 33 to 50 K.
653 _aмонокристаллы
653 _aмартенситные превращения
653 _aдвусторонняя память формы
655 4 _aстатьи в журналах
_9879358
700 1 _aEftifeeva, Anna S.
_9104255
700 1 _aChumlyakov, Yuri I.
_9100866
700 1 _aMaier, Hans Jrgen
_9177218
700 1 _aPanchenko, Elena Yu.
_9104256
773 0 _tMaterials today: proceedings
_d2017
_gVol. 4, № 3, Part B. P. 4789-4796
_x2214-7853
852 4 _aRU-ToGU
856 7 _uhttp://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000620776
908 _aстатья
999 _c431338