000 01970nab a2200349 c 4500
001 vtls000552753
003 RU-ToGU
005 20230319205323.0
007 cr |
008 180311|2015 ru s a eng dd
024 7 _a10.1134/S0021364015110119
_2doi
035 _ato000552753
040 _aRU-ToGU
_brus
_cRU-ToGU
245 1 0 _aStrain-induced localization of electrons in layers of the second-type Ge/Si quantum dots
_cA. I. Yakimov, V. V. Kirienko, A. A. Bloshkin [et.al.]
504 _aБиблиогр.: 15 назв.
520 3 _aElectronic states in multilayer Ge/Si heterostructures with different periods of the arrangement of layers of Ge quantum dots have been studied by the photocurrent spectroscopy method. It has been found that the binding energy of electrons increases with a decrease in the thickness of a silicon spacer and with the extension of Si layers near the vortices of Ge nanoclusters. The results constitute experimental evidence of the deformation mechanism of the formation of localized electronic states in Ge/Si heterostructures with second-type quantum dots.
653 _aквантовые точки
653 _aкремний
653 _aгерманий
653 _aлокализация электронов
655 4 _aстатьи в журналах
_9879358
700 1 _aYakimov, Andrew I.
_9175049
700 1 _aBloshkin, Aleksei A.
_9106764
700 1 _aArmbrister, V. A.
_9175047
700 1 _aDvurechenskii, Anatolii V.
_9175048
700 1 _aKirienko, V. V.
_9175046
773 0 _tJournal of experimental and theoretical physics letters
_d2015
_gVol. 101, № 11. P. 750-753
_x0021-3640
852 4 _aRU-ToGU
856 7 _uhttp://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000552753
908 _aстатья
999 _c408474