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Detection and masking of Trojan Circuits in sequential logic A. Y. Matrosova, E. V. Mitrofanov, S. A. Ostanin, E. A. Nikolaeva by Mitrofanov, Evgenii V | Ostanin, Sergey A | Nikolaeva, Ekaterina A | Matrosova, Anzhela Yu. Source: Proceedings of 2017 IEEE East-West Design & Test Symposium (EWDTS), Novi Sad, Serbia, September 27 – October 2, 2017Material type:  Article; Format:
electronic
available online
 ; Literary form:
Not fiction
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Specialized;
Online access: Click here to access online Availability: No items available :
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Exchange interaction and its tuning in magnetic binary chalcogenides M. G. Vergniory, M. M. Otrokov, D. Thonig [et.al.] by Otrokov, Mikhail M | Thonig, D | Hoffmann, M | Maznichenko, I. V | Geilhufe, M | Zubizarreta, X | Ostanin, Sergey A | Marmodoro, A | Henk, Jurgen | Hergert, W | Mertig, I | Chulkov, Evgueni V | Ernst, Arthur | Vergniory, M. G | Томский государственный университет Физический факультет Научные подразделения ФФ | Томский государственный университет Физический факультет Кафедра физики металлов. Source: Physical Review BMaterial type: Article; Format:
electronic
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A fault-tolerant sequential circuit design for soft errors based on fault-secure circuit S. Ostanin, A. Matrosova, N. Butorina, V. Lavrov by Ostanin, Sergey A | Butorina, Natalia B | Lavrov, V. A | Matrosova, Anzhela Yu. Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2016), Yerevan, Armenia, October 14-17, 2016Material type: Article; Format:
electronic
available online
; Literary form:
Not fiction
; Audience:
Specialized;
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Preventing and masking Trojan Circuits triggering out of working area A. Y. Matrosova, E. V. Mitrofanov, S. A. Ostanin, I. E. Kirienko by Mitrofanov, Evgenii V | Ostanin, Sergey A | Kirienko, Irina E | Matrosova, Anzhela Yu. Source: 2017 European Conference on Circuit Theory and Design (ECCTD), September 4-6, 2017, Catania, ItalyMaterial type: Article; Format:
electronic
available online
; Literary form:
Not fiction
; Audience:
Specialized;
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A fault-tolerant sequential circuit design for SAFs and PDFs soft errors A. Matrosova, S. Ostanin, I. Kirienko, E. Nikolaeva by Matrosova, Anzhela Yu | Kirienko, Irina E | Nikolaeva, Ekaterina A | Ostanin, Sergey A. Source: 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Hotel Eden Roc, Sant Feliu de Guixols, Catalunya, SpainMaterial type: Article; Format:
electronic
available online
; Literary form:
Not fiction
; Audience:
Specialized;
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Fault-tolerant synchronous FSM network design for path delay faults S. A. Ostanin, V. V. Andreeva, N. B. Butorina, D. Tretyakov by Andreeva, V. V | Butorina, Natalia B | Tretyakov, D | Ostanin, Sergey A. Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2018), Kazan, Russia, September 14-17, 2018Material type: Article; Format:
electronic
available online
; Literary form:
Not fiction
; Audience:
Specialized;
Online access: Click here to access online Availability: No items available :
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Patching circuit design based on reserved CLBs A. Matrosova, S. Ostanin, V. Andreeva by Matrosova, Anzhela Yu | Ostanin, Sergey A | Andreeva, V. V. Source: 2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR), 19th - 21st May, Cluj-Napoca, Romania : proceedingsMaterial type: Article; Format:
electronic
available online
; Literary form:
Not fiction
; Audience:
Specialized;
Online access: Click here to access online Availability: No items available :
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Selection of the flip-flops for partial enhanced scan techniques A. Y. Matrosova, A. V. Melnikov, R. V. Mukhamedov, S. A. Ostanin, V. Singh by Melnikov, A. V | Mukhamedov, R. V | Ostanin, Sergey A | Singh, Virendra | Matrosova, Anzhela Yu | Томский государственный университет Факультет прикладной математики и кибернетики Кафедра программирования | Томский государственный университет Факультет прикладной математики и кибернетики Публикации студентов и аспирантов ФПМК. Source: Вестник Томского государственного университета. Управление, вычислительная техника и информатикаMaterial type: Article; Format:
electronic
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