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A high performance scan flip-flop design for serial and mixed mode scan test S. Ahlawat, J. Tudu, A. Matrosova, V. Singh
Material type: ArticleSubject(s): триггеры | мультиплексоры | сканированиеGenre/Form: статьи в сборниках Online resources: Click here to access online In: 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Hotel Eden Roc, Sant Feliu de Guixols, Catalunya, Spain P. 233-238No physical items for this record
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