SAT solvers application of deriving all test pairs detecting robust testable PDFs A. Y. Matrosova, V. V. Andreeva, V. Z. Tychinskiy
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ArticleContent type: Текст Media type: электронный Subject(s): SAT решатели | тестовые пары | тестируемые PDF-файлыGenre/Form: статьи в сборниках Online resources: Click here to access online
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2021 IEEE East-West Design & Test Symposium (EWDTS), Batumi, Georgia, September 10-13, 2021 : proceedings P. 252-255Abstract: It is known that if we have set of test pairs of neighbor Boolean vectors for robust testable PDF for each path considered in the given circuit, we may derive test sequence for these faults consisting of fragments that are characterized by minimal length and minimal power consumption. Conventionally they try to find at least one test pair. It is possible to find all test pairs using operations on ROBDDs. In the frame of SAT technology it is possible to find products presenting test pairs one by one. It seemed that having got several products presenting test pairs we may derive rather high quality test sequence for the given set of circuit paths. New approach to deriving test pairs in the frame of SAT technology is suggested. The approach is based on deriving the combinational circuit that represents all test pairs. This circuit is constructed from the given combinational circuit and the chosen circuit path. The complexity of the obtained circuit practically coincides with the complexity of the given combinational circuit. Using this circuit we may obtain products representing test pairs one by one.
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It is known that if we have set of test pairs of neighbor Boolean vectors for robust testable PDF for each path considered in the given circuit, we may derive test sequence for these faults consisting of fragments that are characterized by minimal length and minimal power consumption. Conventionally they try to find at least one test pair. It is possible to find all test pairs using operations on ROBDDs. In the frame of SAT technology it is possible to find products presenting test pairs one by one. It seemed that having got several products presenting test pairs we may derive rather high quality test sequence for the given set of circuit paths. New approach to deriving test pairs in the frame of SAT technology is suggested. The approach is based on deriving the combinational circuit that represents all test pairs. This circuit is constructed from the given combinational circuit and the chosen circuit path. The complexity of the obtained circuit practically coincides with the complexity of the given combinational circuit. Using this circuit we may obtain products representing test pairs one by one.
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