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Measuring device for design and quality inspection of thin films and multi-layered structures for microelectronics A. V. Panin, S. V. Panin, V. E. Panin by Panin, Alexey V | Panin, Sergey V, 1971- | Panin, Victor E, 1930-2020. Source: Tomsk Region and Taiwan: experience of scientific-technical and innovation cooperation. Vol. 1 : forum proceedings, 16-17 September, 2009, TomskMaterial type:  Article; Format:
print
; Literary form:
Not fiction
; Audience:
Specialized;
Other title: Измерительные устройства для инспектирования качества и дизайна тонких пленок и много-слоевых структур, используемых в микроэлектронике.Availability: No items available :
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New generation of sensors based on nanostructured materials V. E. Panin, A. V. Panin, A. R. Shugurov [et.al.] by Panin, Victor E, 1930-2020 | Panin, Alexey V | Shugurov, Artur R | Zinoviev, V. N | Lebiga, V. A | Miau, J. J | Tu, J. K. Source: Tomsk Region and Taiwan: experience of scientific-technical and innovation cooperation. Vol. 1 : forum proceedings, 16-17 September, 2009, TomskMaterial type: Article; Format:
print
; Literary form:
Not fiction
; Audience:
Specialized;
Other title: Новое поколение сенсоров, основанных на нано-структурированных материалах.Availability: No items available :
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