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	1.	No cover image available A high performance scan flip-flop design for serial and mixed mode scan test S. Ahlawat, J. Tudu, A. Matrosova, V. Singh by Ahlawat, Satyadev \| Matrosova, Anzhela Yu \| Singh, Virendra \| Tudu, Jaynarayan. Source: 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Hotel Eden Roc, Sant Feliu de Guixols, Catalunya, SpainMaterial type: Article; Format: electronic available online ; Literary form: Not fiction ; Audience: Specialized; Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	2.	No cover image available A high performance scan flip-flop design for serial and mixed mode scan test S. Ahlawat, J. Tudu, A. Y. Matrosova, V. Singh by Tudu, Jaynarayan \| Matrosova, Anzhela Yu \| Singh, Virendra \| Ahlawat, Satyadev. Source: IEEE transactions on device and materials reliabilityMaterial type: Article; Format: electronic available online Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	3.	No cover image available Multiple stuck-at fault testability analysis of ROBDD based combinational circuit design T. Shah, A. Y. Matrosova, M. Fujita, V. Singh by Matrosova, Anzhela Yu \| Fujita, Masahiro \| Singh, Virendra \| Shah, Toral. Source: Journal of electronic testingMaterial type: Article; Format: electronic available online Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	4.	No cover image available ROBDD based path delay fault testable combinational circuit synthesis T. Shah, V. Singh, A. Matrosova by Shah, Toral \| Singh, Virendra \| Matrosova, Anzhela Yu. Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2016), Yerevan, Armenia, October 14-17, 2016Material type: Article; Format: electronic available online ; Literary form: Not fiction ; Audience: Specialized; Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	5.	No cover image available Синтез дискретных схем, контролепригодных относительно неисправностей задержек путей А. Ю. Матросова, Е. А. Николаева, V. Singh by Матросова, Анжела Юрьевна \| Николаева, Екатерина Александровна \| Singh, Virendra. Source: Новые информационные технологии в исследовании сложных структур : материалы Девятой Российской конференции с международным участиемMaterial type: Article; Format: print ; Literary form: Not fiction ; Audience: Specialized; Availability: No items available : Log in to add tags Add to cart (remove)
	6.	No cover image available Robust PDFs testing of combinational circuits based on covering BDDs A. Y. Matrosova, E. A. Nikolaeva, S. A. Ostanin, V. Singh by Nikolaeva, Ekaterina A \| Ostanin, Sergey A \| Singh, Virendra \| Matrosova, Anzhela Yu \| Томский государственный университет Факультет прикладной математики и кибернетики Кафедра программирования. Source: Вестник Томского государственного университета. Управление, вычислительная техника и информатикаMaterial type: Article; Format: electronic available online Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	7.	No cover image available Selection of the flip-flops for partial enhanced scan techniques A. Y. Matrosova, A. V. Melnikov, R. V. Mukhamedov, S. A. Ostanin, V. Singh by Melnikov, A. V \| Mukhamedov, R. V \| Ostanin, Sergey A \| Singh, Virendra \| Matrosova, Anzhela Yu \| Томский государственный университет Факультет прикладной математики и кибернетики Кафедра программирования \| Томский государственный университет Факультет прикладной математики и кибернетики Публикации студентов и аспирантов ФПМК. Source: Вестник Томского государственного университета. Управление, вычислительная техника и информатикаMaterial type: Article; Format: electronic available online Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)