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Detection and masking of Trojan Circuits in sequential logic A. Y. Matrosova, E. V. Mitrofanov, S. A. Ostanin, E. A. Nikolaeva by Mitrofanov, Evgenii V | Ostanin, Sergey A | Nikolaeva, Ekaterina A | Matrosova, Anzhela Yu. Source: Proceedings of 2017 IEEE East-West Design & Test Symposium (EWDTS), Novi Sad, Serbia, September 27 – October 2, 2017Material type:  Article; Format:
electronic
available online
 ; Literary form:
Not fiction
; Audience:
Specialized;
Online access: Click here to access online Availability: No items available :
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A fault-tolerant sequential circuit design for SAFs and PDFs soft errors A. Matrosova, S. Ostanin, I. Kirienko, E. Nikolaeva by Matrosova, Anzhela Yu | Kirienko, Irina E | Nikolaeva, Ekaterina A | Ostanin, Sergey A. Source: 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Hotel Eden Roc, Sant Feliu de Guixols, Catalunya, SpainMaterial type: Article; Format:
electronic
available online
; Literary form:
Not fiction
; Audience:
Specialized;
Online access: Click here to access online Availability: No items available :
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