Characterisation of the HEXITEC4S X-ray spectroscopic imaging detector incorporating through-silicon via (TSV) technology M. C. Veale, P. Booker, I. Church [et al.] by Veale, Matthew C | Booker, P | Church, I | Jones, L. L | Lipp, J | Schneider, Andreas | Seller, Paul H | Wilson, Matthew D | Chsherbakov, Ivan | Kolesnikova, Irina I | Lozinskaya, Anastassiya D | Novikov, Vladimir A | Tolbanov, Oleg P | Tyazhev, Anton V | Zarubin, Andrei N.
Source: Nuclear instruments and methods in physics research. Section A : accelerators, spectrometers, detectors and associated equipmentMaterial type: Article; Format:
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