Научная библиотека ТГУ catalog › Results of search for 'su:"критическая толщина"'

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	1.	No cover image available Comparative analysis of germanium-silicon quantum dots formation on Si(100), Si(111) and Sn/Si(100) surfaces K. A. Lozovoy, A. P. Kokhanenko, A. V. Voitsekhovskii by Lozovoy, Kirill A \| Kokhanenko, Andrey P \| Voytsekhovskiy, Alexander V. Source: NanotechnologyMaterial type: Article; Format: electronic available online Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	2.	No cover image available Comparison of the growth processes of germanium quantum dots on the Si (100) and Si(111) surfaces A. P. Kokhanenko, K. A. Lozovoy, A. V. Voitsekhovskii by Kokhanenko, Andrey P \| Lozovoy, Kirill A \| Voytsekhovskiy, Alexander V. Source: Russian physics journalMaterial type: Article; Format: electronic available online Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	3.	No cover image available Growth of germanium quantum dots on oxidized silicon surface K. A. Lozovoy, A. P. Kokhanenko, N. Yu. Akimenko [et al.] by Kokhanenko, Andrey P \| Akimenko, Nataliya Yu \| Dirko, Vladimir V \| Voytsekhovskiy, Alexander V \| Lozovoy, Kirill A. Source: Russian physics journalMaterial type: Article; Format: electronic available online Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)