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Testing digital circuits: studying the increment of the number of states and estimating the fault coverage E. Vinarskii, A. Laputenko, J. López, N. G. Kushik by Laputenko, Andrey V | López, Jorge | Kushik, Natalia G | Vinarskii, Evgenii. Source: 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM 2018), Erlagol, Altai Republic, 29 June - 3 July, 2018 : proceedingsMaterial type:  Article; Format:
electronic
available online
 ; Literary form:
Not fiction
; Audience:
Specialized;
Online access: Click here to access online Availability: No items available :
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