Scientific Library of Tomsk State University

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Your search returned 2 results.

1.
Pseudo-exhaustive testing of sequential circuits for multiple stuck-at faults A. Matrosova, E. Mitrofanov

by Matrosova, Anzhela Yu | Mitrofanov, Evgenii V.

Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2016), Yerevan, Armenia, October 14-17, 2016Material type: Article Article; Format: electronic available online remote; Literary form: Not fiction ; Audience: Specialized; Online access: Click here to access online Availability: No items available :
2.
Fully delay and multiple stuck-at fault testable sequential circuit design A. Y. Matrosova, S. A. Ostanin, E. A. Nikolaeva, I. E. Kirienko

by Matrosova, Anzhela Yu | Nikolaeva, Ekaterina A | Kirienko, Irina E | Ostanin, Sergey A | Томский государственный университет Факультет прикладной математики и кибернетики Кафедра программирования.

Source: Вестник Томского государственного университета. Управление, вычислительная техника и информатикаMaterial type: Article Article; Format: electronic available online remote Online access: Click here to access online Availability: No items available :