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Parallel algorithm for constructing k-valued fault-tolerant diagnostic tests in intelligent systems A. E. Yankovskaya, S. V. Kitler
Material type: ArticleSubject(s): диагностические тесты | параллельные алгоритмы | интеллектуальные системыGenre/Form: статьи в журналах Online resources: Click here to access online In: Pattern recognition and image analysis Vol. 22, № 3. P. 473-482No physical items for this record
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