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Simplification of fully delay testable combinational circuits A. Matrosova, E. Mitrofanov, T. Shah by Matrosova, Anzhela Yu | Mitrofanov, Evgenii V | Shah, Toral. Source: Proceedings of the 21st IEEE International On-Line Testing Symposium Symposium (IOLTS), 6-8 July 2015, Athena Pallas Village, Elia, Halkidiki, GreeceMaterial type:  Article; Format:
electronic
available online
 ; Literary form:
Not fiction
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Specialized;
Online access: Click here to access online Availability: No items available :
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Preventing and masking Trojan Circuits triggering out of working area A. Y. Matrosova, E. V. Mitrofanov, S. A. Ostanin, I. E. Kirienko by Mitrofanov, Evgenii V | Ostanin, Sergey A | Kirienko, Irina E | Matrosova, Anzhela Yu. Source: 2017 European Conference on Circuit Theory and Design (ECCTD), September 4-6, 2017, Catania, ItalyMaterial type: Article; Format:
electronic
available online
; Literary form:
Not fiction
; Audience:
Specialized;
Online access: Click here to access online Availability: No items available :
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Detection and masking of Trojan Circuits in sequential logic A. Y. Matrosova, E. V. Mitrofanov, S. A. Ostanin, E. A. Nikolaeva by Mitrofanov, Evgenii V | Ostanin, Sergey A | Nikolaeva, Ekaterina A | Matrosova, Anzhela Yu. Source: Proceedings of 2017 IEEE East-West Design & Test Symposium (EWDTS), Novi Sad, Serbia, September 27 – October 2, 2017Material type: Article; Format:
electronic
available online
; Literary form:
Not fiction
; Audience:
Specialized;
Online access: Click here to access online Availability: No items available :
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