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Fundamentals of Nanoscale Film Analysis Электронный ресурс by Terry L. Alford, Leonard C. Feldman, James W. Mayer.
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Computer filePublication details: Boston, MA : Springer Science+Business Media, Inc., 2007ISBN: 9780387292618Subject(s): Condensed matter | electronics | Nanotechnology | Particles (Nuclear physics) | Surfaces (Physics) | chemistry | Characterization and Evaluation of Materials | Condensed Matter | Electronics and Microelectronics, Instrumentation | Nanotechnology | Solid State Physics and Spectroscopy | Surfaces and Interfaces, Thin FilmsOnline resources: Click here to access online
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