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Emerging Nanotechnologies Электронный ресурс Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor.
Material type:
Computer fileSeries: Frontiers in Electronic TestingPublication details: Boston, MA : Springer Science+Business Media, LLC, 2008ISBN: 9780387747477Subject(s): Computer engineering | electronics | engineering | Nanotechnology | System safety | Systems engineering | Engineering | Circuits and Systems | Electronic and Computer Engineering | Electronics and Microelectronics, Instrumentation | Nanotechnology | Quality Control, Reliability, Safety and RiskOnline resources: Click here to access online
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Springer eBooks
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