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Measuring device for design and quality inspection of thin films and multi-layered structures for microelectronics A. V. Panin, S. V. Panin, V. E. Panin by Panin, Alexey V | Panin, Sergey V, 1971- | Panin, Victor E, 1930-2020. Source: Tomsk Region and Taiwan: experience of scientific-technical and innovation cooperation. Vol. 1 : forum proceedings, 16-17 September, 2009, TomskMaterial type:  Article; Format:
print
; Literary form:
Not fiction
; Audience:
Specialized;
Other title: Измерительные устройства для инспектирования качества и дизайна тонких пленок и много-слоевых структур, используемых в микроэлектронике.Availability: No items available :
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Computer simulation of thermal cycling of porous coatings: hybrid excitable cellular automata method D. D. Moiseenko, S. V. Panin, P. V. Maksimov [et al.] by Panin, Sergey V, 1971- | Maksimov, P. V | Panin, Victor E, 1930-2020 | Babich, D. S | Shmauder, S | Moiseenko, D. D. Source: Международная конференция "Перспективные материалы с иерархической структурой для новых технологий и надежных конструкций" ; X Международная конференция "Химия нефти и газа" : тезисы докладовMaterial type: Article; Format:
electronic
available online
 ; Literary form:
Not fiction
; Audience:
Specialized;
Online access: Click here to access online Availability: No items available :
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