E-catalog        

Библиогр.: 7 назв.

Single monolayers of various materials (e.g. graphene, silicene, bismuthene, plumbene, etc) have recently become fascinating and promising objects in modern condensed-matter physics and nanotechnology. However, growing a monolayer of non-layered material is still challenging. In the present report, it will be shown that single monolayer NiSi2 can be fabricated at Si(111) surface stabilized by either Tl, Pb or In monolayers. Nickel atoms were found to intercalate the stabilizing metal layers upon deposition and to reside in the interstitial sites inside the first silicon bilayer of bulk-like-terminated Si(111)1×1 surface. The interstitial positions almost coincide with the bulk NiSi2 atomic positions thus forming NiSi2 single layer. Atomic and electronic structure of formed systems is described in detail by means of a set of experimental techniques, including low-energy electron diffraction, scanning tunneling microscopy, angle-resolved photoemission spectroscopy and also first-principles density-functional-theory calculations. Quality of formed single monolayer NiSi2 was additionally confirmed by in situ four-probe transport measurements that show that single monolayer NiSi2 preserves a metallic-type conductivity down to 2.0 K. Moreover it was found that delta-type structure with atomic sheet of NiSi2 silicide embedded into a crystalline Si matrix can be fabricated using room-temperature overgrowth of a Si film onto the Tl stabilized NiSi2 surface layer. Confinement of the NiSi2 layer to a single atomic plane has been directly confirmed by high-resolution transmission electron microscopy.