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	1.	No cover image available Characterisation of the HEXITEC4S X-ray spectroscopic imaging detector incorporating through-silicon via (TSV) technology M. C. Veale, P. Booker, I. Church [et al.] by Veale, Matthew C \| Booker, P \| Church, I \| Jones, L. L \| Lipp, J \| Schneider, Andreas \| Seller, Paul H \| Wilson, Matthew D \| Chsherbakov, Ivan \| Kolesnikova, Irina I \| Lozinskaya, Anastassiya D \| Novikov, Vladimir A \| Tolbanov, Oleg P \| Tyazhev, Anton V \| Zarubin, Andrei N. Source: Nuclear instruments and methods in physics research. Section A : accelerators, spectrometers, detectors and associated equipmentMaterial type: Article; Format: electronic available online Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	2.	No cover image available The influence of contact material and its fabrication on X-ray HR-GaAs:Cr sensor noise characteristics I. Chsherbakov, P. Chsherbakov, I. Kolesnikova [et al.] by Chsherbakov, P \| Kolesnikova, Irina I \| Lozinskaya, Anastassiya D \| Mihaylov, Timofei \| Novikov, Vladimir A \| Tolbanov, Oleg P \| Tyazhev, Anton V \| Zarubin, Andrei N \| Chsherbakov, Ivan. Source: Journal of instrumentation : electronic journalMaterial type: Article; Format: electronic available online Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	3.	No cover image available High-spatial resolution measurements with a GaAs:Cr sensor using the charge integrating MÖNCH detector with a pixel pitch of 25 μm S. Chiriotti, R. Barten, A. Bergamaschi [et al.] by Chiriotti, Sabina \| Barten, Rebecca \| Bergamaschi, Anna \| Carulla, M \| Chsherbakov, Ivan \| Dinapoli, Roberto \| Fröjdh, Erik \| Greiffenberg, Dominic \| Hasanaj, Shqipe \| Hinger, V \| King, T \| Kozlowski, Pawel \| López-Cuenca, Carlos \| Lozinskaya, Anastassiya D \| Marone, F \| Mezza, Davide \| Moustakas, K \| Mozzanica, Aldo \| Ruder, Christian \| Schmitt, Bernd \| Thattil, Dhanya \| Tolbanov, Oleg P \| Tyazhev, Anton V \| Zarubin, Andrei N \| Zhang, J \| Brückner, Martin. Source: Journal of instrumentation : electronic journalMaterial type: Article; Format: electronic available online Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	4.	No cover image available Electron mobility-lifetime and resistivity mapping of GaAs:Cr wafers I. Chsherbakov, I. Kolesnikova, A. Lozinskaya [et.al.] by Chsherbakov, Ivan \| Lozinskaya, Anastassiya D \| Mihaylov, Timofei \| Novikov, Vladimir A \| Shemeryankina, A \| Tolbanov, Oleg P \| Tyazhev, Anton V \| Zarubin, Andrei N \| Kolesnikova, Irina I. Source: Journal of instrumentation : electronic journalMaterial type: Article; Format: electronic available online Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)