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Unique thickness-dependent properties of the van der Waals interlayer antiferromagnet MnBi2Te4 films M. M. Otrokov, I. P. Rusinov, M. Blanco-Rey [et al.] by Rusinov, Igor P | Blanco-Rey, Maria | Hoffmann, M | Vyazovskaya, Alexandra Yu | Eremeev, Sergey V | Ernst, Arthur | Echenique, Pedro Miguel | Arnau, Andrés | Chulkov, Evgueni V | Otrokov, Mikhail M. Source: Physical Review LettersMaterial type: Article; Format:
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Unoccupied electronic structure and relaxation dynamics of Pb/Si(1 1 1) M. Sandhofer, I. Yu. Sklyadneva, V. Sharma [et.al.] by Sandhofer, M | Sharma, V | Miksic Trontla, V | Zhou, P | Ligges, M | Heid, Rolf | Bohnen, Klaus-Peter | Chulkov, Evgueni V | Bovensiepen, U | Sklyadneva, Irina Yu | Томский государственный университет Научное управление Лаборатории НУ | Томский государственный университет Физический факультет Кафедра физики металлов. Source: Journal of Electron Spectroscopy and Related PhenomenaMaterial type: Article; Format:
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