TY  - SER
AU  - Bonchyk,A.Yu
AU  - Savytskyy,Hrygory V.
AU  - Świątek,Zbigniew
AU  - Morgiel,Y.
AU  - Izhnin,Igor I.
AU  - Voytsekhovskiy,Alexander V.
AU  - Korotaev,Alexander G.
AU  - Mynbaev,Karim D.
AU  - Fitsych,Olena I.
AU  - Varavin,Vasilii S.
AU  - Dvoretsky,Sergei A.
AU  - Mikhailov,Nikolay N.
AU  - Yakushev,Maxim V.
TI  - TEM studies of structural defects in HgTe/HgCdTe quantum wells
KW  - квантовые ямы
KW  - структурные дефекты
KW  - молекулярно-лучевая эпитаксия
KW  - просвечивающая электронная микроскопия
KW  - статьи в журналах
N1  - Библиогр.: с. 2871
N2  - Bright-field and high-resolution transmission electron microscopy and microdiffraction have been used for the study of defects in two HgTe/HgCdTe single quantum well (QW) structures grown by molecular beam epitaxy on GaAs substrates with ZnTe and CdTe buffer layers. Defects in QW layers were identified as stacking faults, dislocations, dislocation loops and lattice deformations. The importance of an extra HgCdTe layer placed between the CdTe buffer and HgTe/HgCdTe QW structure for the reduction of defect density both in the barrier layers and in the well itself was demonstrated
UR  - http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:000656168
ER  -