Investigation of the effect of thermal annealing on the electrical properties of the near-surface layer of MBE n-HgCdTe using MIS techniques / A. V. Voytsekhovskii, S. N. Nesmelov, S. M. Dzyadukh [et al.] // Journal of electronic materials. 2020. Vol. 49, № 5. P. 3202-3208. URL: http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000795383