Electrical characterization of insulator-semiconductor systems based on graded band gap MBE HgCdTe with atomic layer deposited Al2O3 films for infrared detector passivation / A. V. Voytsekhovskiy, S. N. Nesmelov, S. M. Dzyadukh [et al.] // Vacuum. 2018. Vol. 158. P. 136-140. URL: http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000788894