Admittance characterization of pentacene metal-insulator-semiconductor capacitors with SiO2 and SiO2/Ga2O3 insulators in temperature range of 9-300 K / A. V. Voytsekhovskiy, S. N. Nesmelov, V. A. Novikov [et al.] // Thin solid films. 2019. Vol. 692. P. 137622 (1-7). URL: http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000791081