Unique thickness-dependent properties of the van der Waals interlayer antiferromagnet MnBi2Te4 films / M. M. Otrokov, I. P. Rusinov, M. Blanco-Rey [et al.] // Physical Review Letters. 2019. Vol. 122, № 10. P. 107202-1-107202-6. URL: http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000674593