TY  - SER
AU  - Iltis,Xavière
AU  - Desgranges,Lionel
AU  - Ammar,Mohamed Ramzi
AU  - Genevois,Cécile
AU  - Bilbao,Emmanuel de
AU  - Canizarès,Aurélien
AU  - Barannikova,Svetlana A.
AU  - Leontyev,Igor N.
AU  - Simon,Patrick
AU  - Maslova,Olga A.
TI  - Characterization of an UO2 ceramic via Raman imaging and electron back-scattering diffraction
KW  - диоксид урана
KW  - керамика
KW  - дифракция обратного рассеяния электронов
KW  - комбинационное рассеяние
KW  - статьи в журналах
N1  - Библиогр.: 37 назв
N2  - A surface state analysis of an UO2 ceramic is performed by combining Raman imaging and electron back-scattering diffraction. Special attention is paid to the behavior of the T2g band intensity versus the crystalline orientation. In order to clarify the origin of the T2g intensity variation in the appropriate Raman image, electron back-scattering diffraction (EBSD) measurements are carried out. EBSD data allow a theoretical estimation of the Raman T2g band intensities. Both maps have been compared in order to correlate them, and to distinguish regions where they are analogous, from those where some physical or chemical effects (stoichiometry, or strains) induce different behavior. More generally, this highlights the interest and the complementarity of combining Raman spectroscopy and EBSD for a better microstructure knowledge
UR  - http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000667791
ER  -