Detection and masking of Trojan Circuits in sequential logic / A. Y. Matrosova, E. V. Mitrofanov, S. A. Ostanin, E. A. Nikolaeva // Proceedings of 2017 IEEE East-West Design & Test Symposium (EWDTS), Novi Sad, Serbia, September 27 – October 2, 2017. [S. l.], 2017. P. 137-140. URL: http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000643965