Electron mobility-lifetime and resistivity mapping of GaAs:Cr wafers / I. Chsherbakov, I. Kolesnikova, A. Lozinskaya [et.al.] // Journal of instrumentation : electronic journal. 2017. Vol. 12, № 2. P. C02016 (1-8). URL: http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000616077