TY  - BOOK
AU  - Hinrichs,Karsten
AU  - Eichhorn,Klaus-Jochen
ED  - SpringerLink (Online service)
TI  - Ellipsometry of Functional Organic Surfaces and Films
T2  - Springer Series in Surface Sciences,
SN  - 9783642401282
AV  - QC176.8.S8 
U1  - 530.417 23
PY  - 2014///
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg, Imprint: Springer
KW  - physics
KW  - Chemistry, Physical organic
KW  - Surfaces (Physics)
KW  - Physics
KW  - Surface and Interface Science, Thin Films
KW  - Surfaces and Interfaces, Thin Films
KW  - Physical Chemistry
KW  - Optics, Optoelectronics, Plasmonics and Optical Devices
KW  - Characterization and Evaluation of Materials
N1  - Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared brillant light sources for micro-ellipsometric studies of organic films -- Collection of optical constants of organic layers
N2  - Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years
UR  - http://dx.doi.org/10.1007/978-3-642-40128-2
ER  -