Hutchison D. Automated Technology for Verification and Analysis 6th International Symposium, ATVA 2008, Seoul, Korea, October 20-23, 2008. Proceedings / / edited by David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Sungdeok (Steve) Cha, Jin-Young Choi, Moonzoo Kim, Insup Lee, Mahesh Viswanathan. // Springer eBooks. URL: http://dx.doi.org/10.1007/978-3-540-88387-6