Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography / A. Moskovchenko, M. Švantner, V. P. Vavilov, A. O. Chulkov // NDT & E International. 2022. Vol. 130. P. 102673 (1-9). URL: http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:001000078