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Assessment of quartz materials crystallinity by x-ray diffraction M. Korovkin, L. Ananieva, T. Nebera, A. Antsiferova

Contributor(s): Korovkin, M. V | Nebera, Tatiana S | Antsiferova, A | Ananieva, LMaterial type: ArticleArticleSubject(s): кварцевые материалы | рентгеновская дифракция | кристалличность | кварц | кварцитыGenre/Form: статьи в журналах Online resources: Click here to access online In: IOP Conference Series: Materials Science and Engineering Vol. 110. P. 012095 (1-4)Abstract: The estimated degree of crystallinity of natural and synthetic grown quartz and quartzite by calculating the x-ray diffraction patterns. It is shown that the index of crystallinity of natural quartzite varies widely, reflecting the different degree of their transformation. The highest values of the index of crystallinity are characterized natural and synthetic single crystals of quartz.
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The estimated degree of crystallinity of natural and synthetic grown quartz and quartzite by calculating the x-ray diffraction patterns. It is shown that the index of crystallinity of natural quartzite varies widely, reflecting the different degree of their transformation. The highest values of the index of crystallinity are characterized natural and synthetic single crystals of quartz.

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