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Admittance spectroscopy of Ge/Si p-i-n structures with Ge quantum dots A. A. Pishchagin, A. V. Voytsekhovskiy, A. P. Kokhanenko [et.al.]

Contributor(s): Pishchagin, Anton A | Kokhanenko, Andrey P | Serokhvostov, V. Yu | Dzyadukh, Stanislav M | Nikiforov, Alexander I | Voytsekhovskiy, Alexander VMaterial type: ArticleArticleSubject(s): квантовые точки | адмиттанс | спектроскопияGenre/Form: статьи в журналах Online resources: Click here to access online In: Journal of Physics: Conference Series Vol. 741. P. 012015 (1-5)Abstract: The experimental results on synthesis of Si/Ge p-i-n structures with Ge quantum dots in the i-region and their investigation by the method of admittance spectroscopy are presented. The activation energies of the emission process from localized states are calculated for two types of structures. Current-voltage characteristics without illumination and under illumination are measured.
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The experimental results on synthesis of Si/Ge p-i-n structures with Ge quantum dots in the i-region and their investigation by the method of admittance spectroscopy are presented. The activation energies of the emission process from localized states are calculated for two types of structures. Current-voltage characteristics without illumination and under illumination are measured.

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