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Quality control of ZnGeP2 single crystals using optical methods V. V. Dyomin, I. G. Polovtsev, D. V. Kamenev

By: Dyomin, Victor VContributor(s): Polovtsev, Igor G | Kamenev, D. VMaterial type: ArticleArticleSubject(s): обнаружение дефектов | дифосфид цинка-германия | оптические методыGenre/Form: статьи в журналах Online resources: Click here to access online In: Russian physics journal Vol. 58, № 10. P. 1479-1481Abstract: A method for detection of subsurface defects in ZnGeP2 crystals is proposed. Evaluation of this method is performed and experimental results are presented.
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A method for detection of subsurface defects in ZnGeP2 crystals is proposed. Evaluation of this method is performed and experimental results are presented.

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