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Surface Science Tools for Nanomaterials Characterization electronic resource edited by Challa S.S.R. Kumar.

Contributor(s): Kumar, Challa S.S.R [editor.] | SpringerLink (Online service)Material type: TextTextPublication details: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015Description: X, 652 p. 293 illus., 221 illus. in color. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9783662445518Subject(s): chemistry | Nanochemistry | Nanoscale science | Nanoscience | Nanostructures | Nanotechnology | Chemistry | Nanochemistry | Nanotechnology | Nanoscale Science and TechnologyDDC classification: 541.2 LOC classification: QD478Online resources: Click here to access online
Contents:
Higher Resolution Scanning Probe Methods for Magnetic Imaging -- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials -- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography -- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy -- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM) -- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy -- Magnetic Force Microscopy -- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films -- FIM-Characterized Tips for SPM -- Scanning Conductive Torsion Mode Microscopy -- Scanning Probe Acceleration Microscopy (SPAM) -- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures -- Field Ion Microscopy (FIM) -- Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.
In: Springer eBooksSummary: Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
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Higher Resolution Scanning Probe Methods for Magnetic Imaging -- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials -- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography -- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy -- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM) -- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy -- Magnetic Force Microscopy -- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films -- FIM-Characterized Tips for SPM -- Scanning Conductive Torsion Mode Microscopy -- Scanning Probe Acceleration Microscopy (SPAM) -- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures -- Field Ion Microscopy (FIM) -- Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.

Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

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