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Computational Forensics electronic resource 5th International Workshop, IWCF 2012, Tsukuba, Japan, November 11, 2012 and 6th International Workshop, IWCF 2014, Stockholm, Sweden, August 24, 2014, Revised Selected Papers / edited by Utpal Garain, Faisal Shafait.

Contributor(s): Garain, Utpal [editor.] | Shafait, Faisal [editor.] | SpringerLink (Online service)Material type: TextTextSeries: Lecture Notes in Computer SciencePublication details: Cham : Springer International Publishing : Imprint: Springer, 2015Description: X, 213 p. 104 illus. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9783319201252Subject(s): Computer Science | Artificial intelligence | Text processing (Computer science) | Image Processing | Pattern Recognition | Computer Science | Pattern Recognition | Image Processing and Computer Vision | Artificial Intelligence (incl. Robotics) | Document Preparation and Text ProcessingDDC classification: 006.4 LOC classification: Q337.5TK7882.P3Online resources: Click here to access online
Contents:
Biometrics -- Document image inspection -- Applications.
In: Springer eBooksSummary: This book constitutes the refereed post-conference proceedings of the 5th and 6th International Workshops on Computational Forensics, IWCF 2012 and IWCF 2014, held in Tsukuba, Japan, in November 2010 and August 2014. The 16 revised full papers and 1 short paper were carefully selected from 34 submissions during a thorough review process. The papers are divided into three broad areas namely biometrics; document image inspection; and applications.
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Biometrics -- Document image inspection -- Applications.

This book constitutes the refereed post-conference proceedings of the 5th and 6th International Workshops on Computational Forensics, IWCF 2012 and IWCF 2014, held in Tsukuba, Japan, in November 2010 and August 2014. The 16 revised full papers and 1 short paper were carefully selected from 34 submissions during a thorough review process. The papers are divided into three broad areas namely biometrics; document image inspection; and applications.

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