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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Электронный ресурс Application to Rough and Natural Surfaces / by Gerd Kaupp.
Material type: Computer filePublication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2006ISBN: 9783540284727Subject(s): Biochemistry | Chemistry, Physical organic | engineering | Life Sciences | Nanotechnology | Physical optics | chemistry | Applied Optics, Optoelectronics, Optical Devices | Life Sciences, general | Medical Biochemistry | Nanotechnology | Physical Chemistry | Physics and Applied Physics in EngineeringOnline resources: Click here to access online In: Springer e-booksNo physical items for this record
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